
Electronic Device Failure Analysis (EDFA)
Electronic Device Failure Analysis™ (EDFA™) is a high demand quarterly technical resource for the modern failure analysis professional. Published in both print and digital versions, each issue covers:
- Contributed technical articles that cover everything from operations to techniques
- Insight into trends in the microelectronics FA industry, to keep you up-to-date
- New product announcements
- Recognition of outstanding contributions to the field of FA
- Looking to update some skills? The Training Calendar provides an easy way to know what courses are coming up in the months ahead.
- News of the Electronic Device Failure Analysis Society.
- Guest Columns provide that vital perspective into other FA
All EDFAS members receive free access to the EDFA Magazine Digital Edition and EDFA Technical Articles as a membership benefit.
If you’d like to purchase a subscription to EDFA magazine, please contact us at [email protected] or by phone at 440.462.0292.
EDFA Author Guidelines (pdf)
EDFA Guest Editorial & Columnist Guidelines (pdf)
EDFA Sample Article (pdf)
Interested in advertising in EDFAS Magazine? There are many opportunities available! View our Media Kit to learn more about these advertising opportunities, or contact Kelly “KJ” Johanns, ASM Business Development Manager.
EDFA Editorial Board
Nicholas Antoniou, KLA, Milpitas, CA, USA
Felix Beaudoin, Immediate Past Chair, GlobalFoundries, Malta, NY, USA
Navid Asadi, University of Florida, Gainesville, FL, USA
Guillaume Bascoul, CNES-French Space Agency, Toulouse, France
Mike Bruce, Past Chair, Independent Consultant, Austin, TX, USA
Jiann Min Chin, AMD Singapore, Singapore
Michael DiBattista, Varioscale Inc., San Marcos, CA, USA
Rosine Coq Germanicus, Universite de Caen Normandie, France
Szu Huat Goh, Qualcomm, Singapore
Jason Holm, NIST, Boulder, CO, USA
Ted Kolasa, Northrop Grumman Space Systems, Scottsdale, AZ, USA
Joy Liao, NVIDIA, San Jose, CA, USA
Rose Ring, Past Chair, NenoVision, Czech Republic
Tom Schamp, E-Space, Dallas, TX, USA
David Su, Yi-Xiang Investment Company, Hsinchu City, Taiwan
Martin Versen, University of Applied Sciences Rosenheim, Germany
Joanne Miller, Senior Editor, ASM International, Materials Park, OH, USA
Vicki Burt, Managing Editor and ASM Staff Liaison, ASM International, Materials Park, OH, USA
EDFA Founding Editors
Ed Cole, Sandia National Laboratories, Albuquerque, NM, USA
Larry Wagner, LWSN Consulting, Plano, TX, USA











