Microelectronics Failure Analysis
Explore ASM resources on failure analysis tools and techniques for microelectronic components
Microelectronics Failure Analysis Desk Reference, Seventh Edition
The Electronic Device Failure Analysis Society proudly announces the Seventh Edition of the Microelectronics Failure Analysis Desk Reference. The new edition will help engineers improve their ability to verify, isolate, uncover, and identify the root cause of failures. Prepared by a team of experts, this updated reference offers the latest information on advanced failure analysis tools and techniques, illustrated with numerous real-life examples.
Print Edition: $190 ASM Members | $250 Non-Members
Digital Library Subscription: $62.02 ASM Members | $79 Non-Members
STEM-in-SEM: Introduction to Scanning Transmission Electron Microscopy for Microelectronics Failure Analysis
Scanning electron microscopes (SEMs) are an essential tool for analyzing microelectronic failures. They reveal features over multiple length scales and can be used, with appropriate detectors, to examine grain size and orientation, compositional distributions, atomic contrast, and more.
Digital Library Subscription: $10 / year | Free to EDFAS Members
ISTFA™ 2021 Proceedings from the 47th International Symposium for Testing and Failure Analysis
The theme for the 2021 conference was System-in-Package (SiP) technology. Papers include discussions on board and system level failure analysis; detecting counterfeit microelectronics; emerging failure analysis techniques and concepts; future challenges of failure analysis; scanning probe analysis; hardware attacks, security, and reverse engineering; microscopy and material characterization; nanoprobing and electrical characterization; and more.
Print Edition: $125 ASM Members | $185 Non-Members
ISTFA™ 2020 Papers Accepted for the Planned 46th International Symposium for Testing and Failure Analysis
The International Symposium for Testing and Failure Analysis is the premier event for scientists and engineers who work to evaluate failures and improve the performance and reliability of semiconductor devices and processing techniques.
Print Edition: $140 ASM Members | $185 Non-Members