Technical Resources

Education Spotlight: Tutorials on Failure Analysis

As part of our commitment to advancing knowledge and professional development in the field of electronics failure analysis, the EDFAS Education Subcommittee has developed a growing library of short-format educational videos—available exclusively to EDFAS members through the ASM CONNECT platform.

These tutorials are designed to support learning and spark discussion, featuring expert insights on key FA topics. To give you a sneak peek, here are just a few of the topics covered:

  • Failure Analysis Procedures and Failure Mechanisms
  • Fault Isolation and Defect Localization
  • Sample Preparation Techniques
  • Advanced Characterization Methods
  • Circuit Modification Techniques


Tutorial Sneak Peak:

Members can access the full library, connect with peers, and participate in educational exchanges directly through the EDFAS Member Community Library on CONNECT.

Unlock full access and join the conversation—become a member today!

Microelectronics Failure Analysis Desk Reference, Seventh Edition

The Microelectronics Failure Analysis, Desk Reference, Seventh Edition offers comprehensive information on advanced failure analysis tools and techniques, illustrated with real-life examples. This book includes information to help engineers improve their ability to verify, isolate, uncover, and identify the root cause of failures

Digital access is provided as part of the EDFAS member benefit package and can be accessed under MY Content on your MY ASM page.

ISTFA Conference Proceedings

The International Symposium for Testing and Failure Analysis is the premier event for scientists and engineers who work to evaluate failures and improve the performance and reliability of semiconductor devices and processing techniques.

ISTFA Proceedings is part of the EDFAS member benefit package and can be accessed under MY Content on your MY ASM page.

Journal of Failure Analysis and Prevention

ASM International’s bimonthly Journal of Failure Analysis and Prevention (JFAP) provides practical information for determining the cause of failures and eliminating future failures. Peer-reviewed articles demonstrate the importance of failure analysis for product and performance improvement and industrial problem solving.

Digital access is provided as part of the EDFAS member benefit package and can be accessed under MY Content on your MY ASM page.

Electronic Device Failure Analysis (EDFA)

Electronic Device Failure Analysis™ (EDFA™) is a high demand quarterly technical resource for the modern failure analysis professional. Published in both print and digital versions, each issue covers:

  • Contributed technical articles that cover everything from operations to techniques
  • Insight into trends in the microelectronics FA industry, to keep you up-to-date
  • New product announcements
  • Recognition of outstanding contributions to the field of FA
  • Looking to update your skills? The Training Calendar provides an easy way to know what courses are coming up in the months ahead.
  • News of the Electronic Device Failure Analysis Society.
  • Guest Columns provide that vital perspective into other FA

Digital access is provided as part of the EDFAS member benefit package and can be accessed under MY Content on your MY ASM page.