{"id":52,"date":"2015-05-29T12:11:22","date_gmt":"2015-05-29T12:11:22","guid":{"rendered":"https:\/\/www.asminternational.org\/edfas\/edfa\/"},"modified":"2026-02-25T13:52:23","modified_gmt":"2026-02-25T13:52:23","slug":"edfa","status":"publish","type":"page","link":"https:\/\/www.asminternational.org\/edfas\/news\/edfa\/","title":{"rendered":"EDFA Magazine"},"content":{"rendered":"\t\t<div data-elementor-type=\"wp-page\" data-elementor-id=\"52\" class=\"elementor elementor-52\" data-elementor-post-type=\"page\">\n\t\t\t\t<div class=\"elementor-element elementor-element-49a6436b e-flex e-con-boxed e-con e-parent\" data-id=\"49a6436b\" data-element_type=\"container\">\n\t\t\t\t\t<div class=\"e-con-inner\">\n\t\t\t\t<div class=\"elementor-element elementor-element-58e09b8e elementor-widget elementor-widget-text-editor\" data-id=\"58e09b8e\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<div class=\"portlet-body\"><div class=\"text-right user-tool-asset-addon-entries\">\u00a0<\/div><div class=\"clearfix journal-content-article\" data-analytics-asset-id=\"25481170\" data-analytics-asset-title=\"EDFA NonMember Sample\" data-analytics-asset-type=\"web-content\"><h2>EDFA Magazine<\/h2><p>EDFA Magazine is a benefit that only members of EDFA receive. <strong><a href=\"\/edfas\/membership\/join\">Sign up<\/a><\/strong> for an EDFAS membership if you want gain access to this quarterly technical magazine.<\/p><p>EDFA Members: Don’t forget to log into your account to get immediate access to the current issue.<\/p><hr \/><\/div><h2 class=\"content-metadata-asset-addon-entries\">Electronic Device Failure Analysis (EDFA)<\/h2><\/div><div class=\"portlet-body\"><div class=\"clearfix journal-content-article\" data-analytics-asset-id=\"6058819\" data-analytics-asset-title=\"EDFA\" data-analytics-asset-type=\"web-content\"><p><img decoding=\"async\" width=\"250\" height=\"198\" class=\"size-medium wp-image-9268 alignright\" src=\"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2026\/02\/EDFA-Aug-2023_Cover-300x238-1-250x198.webp\" alt=\"\" srcset=\"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2026\/02\/EDFA-Aug-2023_Cover-300x238-1-250x198.webp 250w, https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2026\/02\/EDFA-Aug-2023_Cover-300x238-1-120x95.webp 120w, https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2026\/02\/EDFA-Aug-2023_Cover-300x238-1.webp 300w\" sizes=\"(max-width: 250px) 100vw, 250px\" \/><\/p><p>Electronic Device Failure Analysis\u2122 (EDFA\u2122) is a high demand quarterly technical resource for the modern failure analysis professional. Published in both print and digital versions, each issue covers:<\/p><ul><li>Contributed technical articles that cover everything from operations to techniques<\/li><li>Insight into trends in the microelectronics FA industry, to keep you up-to-date<\/li><li>New product announcements<\/li><li>Recognition of outstanding contributions to the field of FA<\/li><li>Looking to update some skills?\u00a0 The Training Calendar provides an easy way to know what courses are coming up in the months ahead.<\/li><li>News of the Electronic Device Failure Analysis Society.<\/li><li>Guest Columns provide that vital perspective into other FA<\/li><\/ul><p>All EDFAS members receive free access to the EDFA Magazine Digital Edition and\u00a0<a href=\"https:\/\/dl.asminternational.org\/edfa-tech\">EDFA Technical Articles<\/a>\u00a0as a membership\u00a0benefit.<\/p><p>If you\u2019d like to purchase a subscription to EDFA magazine, please contact us at\u00a0<a href=\"mailto:memberservicecenter@asminternational.org\" target=\"_blank\" rel=\"noopener noreferrer\">memberservicecenter@asminternational.org<\/a>\u00a0or by phone at 440.462.0292.<\/p><p><a class=\"buttonTertiary gradient\" href=\"\/wp-content\/uploads\/files_edfas\/pdf\/Author Guidelines_2018.pdf\" target=\"_blank\" rel=\"noopener\"><span class=\"large\">EDFA Author Guidelines<\/span><\/a><\/p><p><a class=\"buttonTertiary gradient\" href=\"\/wp-content\/uploads\/files_edfas\/pdf\/Guest Editorial %26 Columnist Guidelines_2018.pdf\" target=\"_blank\" rel=\"noopener\"><span class=\"large\">EDFA Guest Editorial &amp; Columnist Guidelines<\/span><\/a><\/p><p><a class=\"buttonTertiary gradient\" href=\"\/wp-content\/uploads\/files_edfas\/pdf\/EDFA_Feb22_3till10 %281%29.pdf\" target=\"_blank\" rel=\"noopener\"><span class=\"large\">EDFA Sample Article<\/span><\/a><\/p><hr \/><p style=\"margin-left: 40px\"><strong>EDFA Editorial Board:<\/strong><\/p><p style=\"margin-left: 40px\"><a href=\"mailto:nicholas.antoniou@kla.com\" target=\"_blank\" rel=\"noopener noreferrer\">Nicholas Antoniou,<\/a>\u00a0KLA, Milpitas, CA, USA<br \/>Felix Beaudoin, Immediate Past Chair, GlobalFoundries, Malta, NY, USA<br \/>Navid Asadi, University of Florida, Gainesville, FL, USA<br \/>Guillaume Bascoul, CNES-French Space Agency, Toulouse, France<br \/>Mike Bruce, Past Chair, Independent Consultant, Austin, TX, USA<br \/>Jiann Min Chin, AMD Singapore, Singapore<br \/>Michael DiBattista, Varioscale Inc., San Marcos, CA, USA<br \/>Rosine Coq Germanicus, Universite de Caen Normandie, France<br \/>Szu Huat Goh, Qualcomm, Singapore<br \/>Jason Holm, NIST, Boulder, CO, USA<br \/>Ted Kolasa, Northrop Grumman Space Systems, Scottsdale, AZ, USA<br \/>Joy Liao, NVIDIA, San Jose, CA, USA<br \/>Rose Ring, Past Chair, NenoVision, Czech Republic<br \/>Tom Schamp, E-Space, Dallas, TX, USA<br \/>David Su, Yi-Xiang Investment Company, Hsinchu City, Taiwan<br \/>Martin Versen, University of Applied Sciences Rosenheim, Germany<br \/>Joanne Miller, Senior Editor, ASM International, Materials Park, OH, USA<br \/>Vicki Burt, Managing Editor and ASM Staff Liaison, ASM International, Materials Park, OH, USA<\/p><p style=\"margin-left: 40px\"><strong>EDFA Founding Editors<\/strong><br \/>Ed Cole, Sandia National Laboratories, Albuquerque, NM, USA<br \/>Larry Wagner, LWSN Consulting, Plano, TX, USA<\/p><\/div><div class=\"content-metadata-asset-addon-entries\"><div class=\"content-metadata-asset-addon-entry content-metadata-asset-addon-entry-links\">\u00a0<\/div><\/div><\/div>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t","protected":false},"excerpt":{"rendered":"<p>\u00a0 EDFA Magazine EDFA Magazine is a benefit that only members of EDFA receive. Sign up for an EDFAS membership if you want gain access to this quarterly technical magazine. EDFA Members: Don’t forget to log into your account to get immediate access to the current issue. Electronic Device Failure Analysis (EDFA) Electronic Device Failure… <a class=\"view-article\" href=\"https:\/\/www.asminternational.org\/edfas\/news\/edfa\/\">View Article<\/a><\/p>\n","protected":false},"author":63093,"featured_media":0,"parent":29,"menu_order":4,"comment_status":"open","ping_status":"closed","template":"","meta":{"_acf_changed":false,"footnotes":""},"class_list":["post-52","page","type-page","status-publish","hentry"],"bricks_content":"","yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v25.4 - https:\/\/yoast.com\/wordpress\/plugins\/seo\/ -->\n<title>EDFA Magazine - Electronic Device Failure Analysis Society<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.asminternational.org\/edfas\/news\/edfa\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"EDFA Magazine - Electronic Device Failure Analysis Society\" \/>\n<meta property=\"og:description\" content=\"\u00a0 EDFA Magazine EDFA Magazine is a benefit that only members of EDFA receive. 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