{"id":30,"date":"2014-05-28T15:36:33","date_gmt":"2014-05-28T15:36:33","guid":{"rendered":"https:\/\/www.asminternational.org\/edfas\/technical\/"},"modified":"2025-06-09T18:16:18","modified_gmt":"2025-06-09T18:16:18","slug":"technical","status":"publish","type":"page","link":"https:\/\/www.asminternational.org\/edfas\/technical\/","title":{"rendered":"Technical Resources"},"content":{"rendered":"\t\t<div data-elementor-type=\"wp-page\" data-elementor-id=\"30\" class=\"elementor elementor-30\" data-elementor-post-type=\"page\">\n\t\t\t\t<div class=\"elementor-element elementor-element-f635ba4 e-flex e-con-boxed e-con e-parent\" data-id=\"f635ba4\" data-element_type=\"container\">\n\t\t\t\t\t<div class=\"e-con-inner\">\n\t\t\t\t<div class=\"elementor-element elementor-element-5e91919a elementor-widget elementor-widget-text-editor\" data-id=\"5e91919a\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<h1>Technical Resources<\/h1><h3>Education Spotlight: Tutorials on Failure Analysis<\/h3><p>As part of our commitment to advancing knowledge and professional development in the field of electronics failure analysis, the EDFAS Education Subcommittee has developed a growing library of short-format educational videos\u2014available exclusively to EDFAS members through the ASM CONNECT platform.<\/p><p>These tutorials are designed to support learning and spark discussion, featuring expert insights on key FA topics. To give you a sneak peek, here are just a few of the topics covered:<\/p><ul><li>Failure Analysis Procedures and Failure Mechanisms<\/li><li>Fault Isolation and Defect Localization<\/li><li>Sample Preparation Techniques<\/li><li>Advanced Characterization Methods<\/li><li>Circuit Modification Techniques<\/li><\/ul><p><span style=\"text-decoration: underline\"><strong><br \/>Tutorial Sneak Peak:<\/strong><\/span><\/p><ul><li><a href=\"https:\/\/youtu.be\/sN910hDs_es\" target=\"_blank\" rel=\"noopener\">Advanced Sample Preparation Tutorial<\/a><br \/>Prepared by Jim Colvin – 2024<\/li><li><a href=\"https:\/\/www.youtube.com\/watch?v=e2xuaOWh3Aw\" target=\"_blank\" rel=\"noopener\">Technique Selection for Front End of Line Defect Localization in Bulk Si FA<\/a><br \/>Prepared by Greg Johnson – 2020<\/li><\/ul><p>Members can access the full library, connect with peers, and participate in educational exchanges directly through the EDFAS Member Community Library on <a href=\"https:\/\/connect.asminternational.org\/communities\/community-home\/librarydocuments?communitykey=e7c0f2b9-017b-49a6-b62f-854978ac2652&amp;LibraryFolderKey=&amp;DefaultView=\" target=\"_blank\" rel=\"noopener\">CONNECT<\/a>.<\/p><p>Unlock full access and join the conversation\u2014<a href=\"https:\/\/www.asminternational.org\/membership\/membership-communities\/individual-memberships\/\" target=\"_blank\" rel=\"noopener\">become a member<\/a> today!<\/p><hr \/><h3>Microelectronics Failure Analysis Desk Reference, Seventh Edition<\/h3><p>The Microelectronics Failure Analysis, Desk Reference, Seventh Edition offers comprehensive information on advanced failure analysis tools and techniques, illustrated with real-life examples. This book includes information to help engineers improve their ability to verify, isolate, uncover, and identify the root cause of failures<\/p><p>Digital access is provided as part of the EDFAS member benefit package and can be accessed under MY Content on your MY ASM page.<\/p><hr \/><h3>ISTFA Conference Proceedings<\/h3><p>The International Symposium for Testing and Failure Analysis is the premier event for scientists and engineers who work to evaluate failures and improve the performance and reliability of semiconductor devices and processing techniques.<\/p><p>ISTFA Proceedings is part of the EDFAS member benefit package and can be accessed under MY Content on your MY ASM page.<\/p><hr \/><h3>Journal of Failure Analysis and Prevention<\/h3><p>ASM International\u2019s bimonthly Journal of Failure Analysis and Prevention (JFAP) provides practical information for determining the cause of failures and eliminating future failures. Peer-reviewed articles demonstrate the importance of failure analysis for product and performance improvement and industrial problem solving.<\/p><p>Digital access is provided as part of the EDFAS member benefit package and can be accessed under MY Content on your MY ASM page.<\/p><hr \/><h3>Electronic Device Failure Analysis (EDFA)<\/h3><p>Electronic Device Failure Analysis\u2122 (EDFA\u2122) is a high demand quarterly technical resource for the modern failure analysis professional. Published in both print and digital versions, each issue covers:<\/p><ul><li>Contributed technical articles that cover everything from operations to techniques<\/li><li>Insight into trends in the microelectronics FA industry, to keep you up-to-date<\/li><li>New product announcements<\/li><li>Recognition of outstanding contributions to the field of FA<\/li><li>Looking to update your skills? The Training Calendar provides an easy way to know what courses are coming up in the months ahead.<\/li><li>News of the Electronic Device Failure Analysis Society.<\/li><li>Guest Columns provide that vital perspective into other FA<\/li><\/ul><p>Digital access is provided as part of the EDFAS member benefit package and can be accessed under MY Content on your MY ASM page.<\/p><hr \/>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t","protected":false},"excerpt":{"rendered":"<p>Technical Resources Education Spotlight: Tutorials on Failure Analysis As part of our commitment to advancing knowledge and professional development in the field of electronics failure analysis, the EDFAS Education Subcommittee has developed a growing library of short-format educational videos\u2014available exclusively to EDFAS members through the ASM CONNECT platform. These tutorials are designed to support learning… <a class=\"view-article\" href=\"https:\/\/www.asminternational.org\/edfas\/technical\/\">View Article<\/a><\/p>\n","protected":false},"author":63093,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"open","ping_status":"closed","template":"","meta":{"_acf_changed":false,"footnotes":""},"class_list":["post-30","page","type-page","status-publish","hentry"],"bricks_content":"","yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v25.4 - https:\/\/yoast.com\/wordpress\/plugins\/seo\/ -->\n<title>Technical Resources - Electronic Device Failure Analysis Society<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.asminternational.org\/edfas\/technical\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Technical Resources - Electronic Device Failure Analysis Society\" \/>\n<meta property=\"og:description\" content=\"Technical Resources Education Spotlight: Tutorials on Failure Analysis As part of our commitment to advancing knowledge and professional development in the field of electronics failure analysis, the EDFAS Education Subcommittee has developed a growing library of short-format educational videos\u2014available exclusively to EDFAS members through the ASM CONNECT platform. These tutorials are designed to support learning... View Article\" \/>\n<meta property=\"og:url\" content=\"https:\/\/www.asminternational.org\/edfas\/technical\/\" \/>\n<meta property=\"og:site_name\" content=\"Electronic Device Failure Analysis Society\" \/>\n<meta property=\"article:modified_time\" content=\"2025-06-09T18:16:18+00:00\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Est. reading time\" \/>\n\t<meta name=\"twitter:data1\" content=\"3 minutes\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\/\/schema.org\",\"@graph\":[{\"@type\":\"WebPage\",\"@id\":\"https:\/\/www.asminternational.org\/edfas\/technical\/\",\"url\":\"https:\/\/www.asminternational.org\/edfas\/technical\/\",\"name\":\"Technical Resources - Electronic Device Failure Analysis Society\",\"isPartOf\":{\"@id\":\"https:\/\/www.asminternational.org\/edfas\/#website\"},\"datePublished\":\"2014-05-28T15:36:33+00:00\",\"dateModified\":\"2025-06-09T18:16:18+00:00\",\"breadcrumb\":{\"@id\":\"https:\/\/www.asminternational.org\/edfas\/technical\/#breadcrumb\"},\"inLanguage\":\"en-US\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\/\/www.asminternational.org\/edfas\/technical\/\"]}]},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\/\/www.asminternational.org\/edfas\/technical\/#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\/\/www.asminternational.org\/edfas\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"Technical Resources\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\/\/www.asminternational.org\/edfas\/#website\",\"url\":\"https:\/\/www.asminternational.org\/edfas\/\",\"name\":\"Electronic Device Failure Analysis Society\",\"description\":\"Electronic Device Failure Analysis Society\",\"publisher\":{\"@id\":\"https:\/\/www.asminternational.org\/edfas\/#organization\"},\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"https:\/\/www.asminternational.org\/edfas\/?s={search_term_string}\"},\"query-input\":{\"@type\":\"PropertyValueSpecification\",\"valueRequired\":true,\"valueName\":\"search_term_string\"}}],\"inLanguage\":\"en-US\"},{\"@type\":\"Organization\",\"@id\":\"https:\/\/www.asminternational.org\/edfas\/#organization\",\"name\":\"Electronic Device Failure Analysis Society\",\"url\":\"https:\/\/www.asminternational.org\/edfas\/\",\"logo\":{\"@type\":\"ImageObject\",\"inLanguage\":\"en-US\",\"@id\":\"https:\/\/www.asminternational.org\/edfas\/#\/schema\/logo\/image\/\",\"url\":\"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2022\/10\/layout_set_logo.png\",\"contentUrl\":\"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2022\/10\/layout_set_logo.png\",\"width\":360,\"height\":95,\"caption\":\"Electronic Device Failure Analysis Society\"},\"image\":{\"@id\":\"https:\/\/www.asminternational.org\/edfas\/#\/schema\/logo\/image\/\"}}]}<\/script>\n<!-- \/ Yoast SEO plugin. -->","yoast_head_json":{"title":"Technical Resources - Electronic Device Failure Analysis Society","robots":{"index":"index","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"canonical":"https:\/\/www.asminternational.org\/edfas\/technical\/","og_locale":"en_US","og_type":"article","og_title":"Technical Resources - Electronic Device Failure Analysis Society","og_description":"Technical Resources Education Spotlight: Tutorials on Failure Analysis As part of our commitment to advancing knowledge and professional development in the field of electronics failure analysis, the EDFAS Education Subcommittee has developed a growing library of short-format educational videos\u2014available exclusively to EDFAS members through the ASM CONNECT platform. These tutorials are designed to support learning... View Article","og_url":"https:\/\/www.asminternational.org\/edfas\/technical\/","og_site_name":"Electronic Device Failure Analysis Society","article_modified_time":"2025-06-09T18:16:18+00:00","twitter_card":"summary_large_image","twitter_misc":{"Est. reading time":"3 minutes"},"schema":{"@context":"https:\/\/schema.org","@graph":[{"@type":"WebPage","@id":"https:\/\/www.asminternational.org\/edfas\/technical\/","url":"https:\/\/www.asminternational.org\/edfas\/technical\/","name":"Technical Resources - Electronic Device Failure Analysis Society","isPartOf":{"@id":"https:\/\/www.asminternational.org\/edfas\/#website"},"datePublished":"2014-05-28T15:36:33+00:00","dateModified":"2025-06-09T18:16:18+00:00","breadcrumb":{"@id":"https:\/\/www.asminternational.org\/edfas\/technical\/#breadcrumb"},"inLanguage":"en-US","potentialAction":[{"@type":"ReadAction","target":["https:\/\/www.asminternational.org\/edfas\/technical\/"]}]},{"@type":"BreadcrumbList","@id":"https:\/\/www.asminternational.org\/edfas\/technical\/#breadcrumb","itemListElement":[{"@type":"ListItem","position":1,"name":"Home","item":"https:\/\/www.asminternational.org\/edfas\/"},{"@type":"ListItem","position":2,"name":"Technical Resources"}]},{"@type":"WebSite","@id":"https:\/\/www.asminternational.org\/edfas\/#website","url":"https:\/\/www.asminternational.org\/edfas\/","name":"Electronic Device Failure Analysis Society","description":"Electronic Device Failure Analysis Society","publisher":{"@id":"https:\/\/www.asminternational.org\/edfas\/#organization"},"potentialAction":[{"@type":"SearchAction","target":{"@type":"EntryPoint","urlTemplate":"https:\/\/www.asminternational.org\/edfas\/?s={search_term_string}"},"query-input":{"@type":"PropertyValueSpecification","valueRequired":true,"valueName":"search_term_string"}}],"inLanguage":"en-US"},{"@type":"Organization","@id":"https:\/\/www.asminternational.org\/edfas\/#organization","name":"Electronic Device Failure Analysis Society","url":"https:\/\/www.asminternational.org\/edfas\/","logo":{"@type":"ImageObject","inLanguage":"en-US","@id":"https:\/\/www.asminternational.org\/edfas\/#\/schema\/logo\/image\/","url":"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2022\/10\/layout_set_logo.png","contentUrl":"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2022\/10\/layout_set_logo.png","width":360,"height":95,"caption":"Electronic Device Failure Analysis Society"},"image":{"@id":"https:\/\/www.asminternational.org\/edfas\/#\/schema\/logo\/image\/"}}]}},"acf":[],"_links":{"self":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/pages\/30","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/users\/63093"}],"replies":[{"embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/comments?post=30"}],"version-history":[{"count":5,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/pages\/30\/revisions"}],"predecessor-version":[{"id":8796,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/pages\/30\/revisions\/8796"}],"wp:attachment":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/media?parent=30"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}