{"id":21,"date":"2014-05-28T14:11:46","date_gmt":"2014-05-28T14:11:46","guid":{"rendered":"https:\/\/www.asminternational.org\/edfas\/membership\/"},"modified":"2024-12-05T04:01:08","modified_gmt":"2024-12-05T04:01:08","slug":"membership","status":"publish","type":"page","link":"https:\/\/www.asminternational.org\/edfas\/membership\/","title":{"rendered":"Membership &amp; Networking"},"content":{"rendered":"<div class=\"text-right user-tool-asset-addon-entries\"><\/div>\n<div class=\"clearfix journal-content-article\" data-analytics-asset-id=\"19141240\" data-analytics-asset-title=\"Membership &amp; Networking\" data-analytics-asset-type=\"web-content\">\n<h1>Membership &amp; Networking<\/h1>\n<p>The EDFAS Community provides you with the tools, the environments and the opportunities to connect to everyone you need to know! Registered Users can access the Forums and ask the critical questions that only our experienced members know the answers to. Members get full access to the entire membership through the membership directory, through expertise finder and through personal interaction on committees, event planning, teaching courses, participating in conferences and expos and more!<\/p>\n<p><a class=\"buttonPrimary gradient\" href=\"https:\/\/www.asminternational.org\/?option=saml_user_login&amp;idp=Salesforce&amp;redirect_to=https%3A%2F%2Fwww.asminternational.org%2Fprofile-information%2F\" target=\"_blank\" rel=\"noopener\"><span class=\"large\">Join \/ Renew Today!<\/span><\/a><\/p>\n<\/div>\n<div class=\"content-metadata-asset-addon-entries\"><\/div>\n<div class=\"portlet-layout row-fluid\">\n<div id=\"column-3\" class=\"col-md-6 portlet-column portlet-column-first\">\n<div id=\"layout-column_column-3\" class=\"portlet-dropzone portlet-column-content portlet-column-content-first\">\n<div id=\"p_p_id_com_liferay_journal_content_web_portlet_JournalContentPortlet_INSTANCE_gxAfCP0lJCBH_\" class=\"portlet-boundary portlet-boundary_com_liferay_journal_content_web_portlet_JournalContentPortlet_ portlet-static portlet-static-end portlet-borderless portlet-journal-content \">\n<p>&nbsp;<\/p>\n<section id=\"portlet_com_liferay_journal_content_web_portlet_JournalContentPortlet_INSTANCE_gxAfCP0lJCBH\" class=\"portlet \">\n<div class=\"portlet-content\">\n<h2 class=\"portlet-title-text\">Benefits of Membership<\/h2>\n<div class=\" portlet-content-container\">\n<div class=\"portlet-body\">\n<div class=\"text-right user-tool-asset-addon-entries\"><\/div>\n<div class=\"clearfix journal-content-article\" data-analytics-asset-id=\"19141260\" data-analytics-asset-title=\"Benefits of Membership\" data-analytics-asset-type=\"web-content\">\n<ul style=\"margin-left: 40px;\">\n<li><a href=\"\/edfas\/news\/edfa\">EDFA Magazine<\/a><\/li>\n<li><a href=\"https:\/\/dl.asminternational.org\/istfa\">Free Access to ISTFA Proceedings<\/a><\/li>\n<li><a href=\"\/edfas\/technical\/desk-reference\">Microelectronics Failure Analysis Desk Reference, 7th Edition <\/a><\/li>\n<li><a href=\"\/edfas\/membership\/chapters\">Free Membership in a Chapter Near You<\/a><\/li>\n<li><a href=\"\/materials-resources\/journals\/\">Free Access to Valuable Journals<\/a><\/li>\n<li><a href=\"\/edfas\/membership\/member-benefits\">View\u00a0 more &gt;<\/a><\/li>\n<\/ul>\n<\/div>\n<div class=\"content-metadata-asset-addon-entries\"><\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/section>\n<\/div>\n<div id=\"p_p_id_com_liferay_journal_content_web_portlet_JournalContentPortlet_INSTANCE_vYs3sFWBlH7h_\" class=\"portlet-boundary portlet-boundary_com_liferay_journal_content_web_portlet_JournalContentPortlet_ portlet-static portlet-static-end portlet-borderless portlet-journal-content \">\n<p>&nbsp;<\/p>\n<section id=\"portlet_com_liferay_journal_content_web_portlet_JournalContentPortlet_INSTANCE_vYs3sFWBlH7h\" class=\"portlet \">\n<div class=\"portlet-content\">\n<h2 class=\"portlet-title-text\">Connect with EDFA<\/h2>\n<div class=\" portlet-content-container\">\n<div class=\"portlet-body\">\n<div class=\"text-right user-tool-asset-addon-entries\"><\/div>\n<div class=\"clearfix journal-content-article\" data-analytics-asset-id=\"26957237\" data-analytics-asset-title=\"Connect with EDFA\" data-analytics-asset-type=\"web-content\">\n<p>Add us on social media sites to get updates on what’s going on in the society, discuss questions with other members, read interesting news, and more. Plus, sometimes we throw in jokes that only engineers could love.<\/p>\n<p>Follow us on<\/p>\n<div class=\"social\"><a href=\"https:\/\/twitter.com\/asm_edfas\" target=\"_blank\" rel=\"noopener\"><img decoding=\"async\" src=\"\/wp-content\/uploads\/images\/twitter.png\" \/><\/a>\u00a0 <a href=\"https:\/\/www.facebook.com\/Electronic-Device-Failure-Analysis-Society-EDFAS-1963499510541166\/?fref=ts\" target=\"_blank\" rel=\"noopener\"><img decoding=\"async\" src=\"\/wp-content\/uploads\/images\/facebook.png\" \/><\/a>\u00a0\u00a0<a href=\"https:\/\/www.linkedin.com\/groups\/766897\/profile\" target=\"_blank\" rel=\"noopener\"><img decoding=\"async\" src=\"\/wp-content\/uploads\/images\/linkedIn.png\" \/><\/a><\/div>\n<\/div>\n<div class=\"content-metadata-asset-addon-entries\"><\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/section>\n<\/div>\n<\/div>\n<\/div>\n<div id=\"column-4\" class=\"col-md-6 portlet-column portlet-column-last\">\n<div id=\"layout-column_column-4\" class=\"portlet-dropzone portlet-column-content portlet-column-content-last\">\n<div id=\"p_p_id_com_liferay_journal_content_web_portlet_JournalContentPortlet_INSTANCE_KgbsXCUkT2D8_\" class=\"portlet-boundary portlet-boundary_com_liferay_journal_content_web_portlet_JournalContentPortlet_ portlet-static portlet-static-end portlet-borderless portlet-journal-content \">\n<p>&nbsp;<\/p>\n<section id=\"portlet_com_liferay_journal_content_web_portlet_JournalContentPortlet_INSTANCE_KgbsXCUkT2D8\" class=\"portlet \">\n<div class=\"portlet-content\">\n<h2 class=\"portlet-title-text\">Get Involved<\/h2>\n<div class=\" portlet-content-container\">\n<div class=\"portlet-body\">\n<div class=\"text-right user-tool-asset-addon-entries\"><\/div>\n<div class=\"clearfix journal-content-article\" data-analytics-asset-id=\"19141277\" data-analytics-asset-title=\"Get Involved\" data-analytics-asset-type=\"web-content\">\n<p>EDFAS committees channel member involvement into tangible programs, products and services. These committees stay on top of technical advances and other areas of member interest. By doing so, they bring new information to the members of EDFAS through products and services including:<\/p>\n<ul style=\"margin-left: 40px;\">\n<li>Conference and exposition programming<\/li>\n<li>Course development<\/li>\n<li>Reference and periodical publications<\/li>\n<li>Research and development planning and implementation<\/li>\n<\/ul>\n<p><a href=\"\/edfas\/membership\/get-involved\">Get involved, get connected and get ahead by becoming an EDFAS volunteer<\/a>.<\/p>\n<\/div>\n<div class=\"content-metadata-asset-addon-entries\"><\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/section>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n","protected":false},"excerpt":{"rendered":"<p>Membership &amp; Networking The EDFAS Community provides you with the tools, the environments and the opportunities to connect to everyone you need to know! Registered Users can access the Forums and ask the critical questions that only our experienced members know the answers to. Members get full access to the entire membership through the membership… <a class=\"view-article\" href=\"https:\/\/www.asminternational.org\/edfas\/membership\/\">View Article<\/a><\/p>\n","protected":false},"author":63093,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"open","ping_status":"closed","template":"","meta":{"_acf_changed":false,"footnotes":""},"class_list":["post-21","page","type-page","status-publish","hentry"],"bricks_content":"","yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v25.4 - https:\/\/yoast.com\/wordpress\/plugins\/seo\/ -->\n<title>Membership &amp; Networking - Electronic Device Failure Analysis Society<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.asminternational.org\/edfas\/membership\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Membership &amp; Networking - Electronic Device Failure Analysis Society\" \/>\n<meta property=\"og:description\" content=\"Membership &amp; Networking The EDFAS Community provides you with the tools, the environments and the opportunities to connect to everyone you need to know! Registered Users can access the Forums and ask the critical questions that only our experienced members know the answers to. Members get full access to the entire membership through the membership... View Article\" \/>\n<meta property=\"og:url\" content=\"https:\/\/www.asminternational.org\/edfas\/membership\/\" \/>\n<meta property=\"og:site_name\" content=\"Electronic Device Failure Analysis Society\" \/>\n<meta property=\"article:modified_time\" content=\"2024-12-05T04:01:08+00:00\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Est. reading time\" \/>\n\t<meta name=\"twitter:data1\" content=\"1 minute\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\/\/schema.org\",\"@graph\":[{\"@type\":\"WebPage\",\"@id\":\"https:\/\/www.asminternational.org\/edfas\/membership\/\",\"url\":\"https:\/\/www.asminternational.org\/edfas\/membership\/\",\"name\":\"Membership &amp; Networking - Electronic Device Failure Analysis Society\",\"isPartOf\":{\"@id\":\"https:\/\/www.asminternational.org\/edfas\/#website\"},\"datePublished\":\"2014-05-28T14:11:46+00:00\",\"dateModified\":\"2024-12-05T04:01:08+00:00\",\"breadcrumb\":{\"@id\":\"https:\/\/www.asminternational.org\/edfas\/membership\/#breadcrumb\"},\"inLanguage\":\"en-US\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\/\/www.asminternational.org\/edfas\/membership\/\"]}]},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\/\/www.asminternational.org\/edfas\/membership\/#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\/\/www.asminternational.org\/edfas\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"Membership &amp; Networking\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\/\/www.asminternational.org\/edfas\/#website\",\"url\":\"https:\/\/www.asminternational.org\/edfas\/\",\"name\":\"Electronic Device Failure Analysis Society\",\"description\":\"Electronic Device Failure Analysis Society\",\"publisher\":{\"@id\":\"https:\/\/www.asminternational.org\/edfas\/#organization\"},\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"https:\/\/www.asminternational.org\/edfas\/?s={search_term_string}\"},\"query-input\":{\"@type\":\"PropertyValueSpecification\",\"valueRequired\":true,\"valueName\":\"search_term_string\"}}],\"inLanguage\":\"en-US\"},{\"@type\":\"Organization\",\"@id\":\"https:\/\/www.asminternational.org\/edfas\/#organization\",\"name\":\"Electronic Device Failure Analysis Society\",\"url\":\"https:\/\/www.asminternational.org\/edfas\/\",\"logo\":{\"@type\":\"ImageObject\",\"inLanguage\":\"en-US\",\"@id\":\"https:\/\/www.asminternational.org\/edfas\/#\/schema\/logo\/image\/\",\"url\":\"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2022\/10\/layout_set_logo.png\",\"contentUrl\":\"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2022\/10\/layout_set_logo.png\",\"width\":360,\"height\":95,\"caption\":\"Electronic Device Failure Analysis Society\"},\"image\":{\"@id\":\"https:\/\/www.asminternational.org\/edfas\/#\/schema\/logo\/image\/\"}}]}<\/script>\n<!-- \/ Yoast SEO plugin. -->","yoast_head_json":{"title":"Membership &amp; Networking - Electronic Device Failure Analysis Society","robots":{"index":"index","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"canonical":"https:\/\/www.asminternational.org\/edfas\/membership\/","og_locale":"en_US","og_type":"article","og_title":"Membership &amp; Networking - Electronic Device Failure Analysis Society","og_description":"Membership &amp; Networking The EDFAS Community provides you with the tools, the environments and the opportunities to connect to everyone you need to know! Registered Users can access the Forums and ask the critical questions that only our experienced members know the answers to. Members get full access to the entire membership through the membership... View Article","og_url":"https:\/\/www.asminternational.org\/edfas\/membership\/","og_site_name":"Electronic Device Failure Analysis Society","article_modified_time":"2024-12-05T04:01:08+00:00","twitter_card":"summary_large_image","twitter_misc":{"Est. reading time":"1 minute"},"schema":{"@context":"https:\/\/schema.org","@graph":[{"@type":"WebPage","@id":"https:\/\/www.asminternational.org\/edfas\/membership\/","url":"https:\/\/www.asminternational.org\/edfas\/membership\/","name":"Membership &amp; Networking - Electronic Device Failure Analysis Society","isPartOf":{"@id":"https:\/\/www.asminternational.org\/edfas\/#website"},"datePublished":"2014-05-28T14:11:46+00:00","dateModified":"2024-12-05T04:01:08+00:00","breadcrumb":{"@id":"https:\/\/www.asminternational.org\/edfas\/membership\/#breadcrumb"},"inLanguage":"en-US","potentialAction":[{"@type":"ReadAction","target":["https:\/\/www.asminternational.org\/edfas\/membership\/"]}]},{"@type":"BreadcrumbList","@id":"https:\/\/www.asminternational.org\/edfas\/membership\/#breadcrumb","itemListElement":[{"@type":"ListItem","position":1,"name":"Home","item":"https:\/\/www.asminternational.org\/edfas\/"},{"@type":"ListItem","position":2,"name":"Membership &amp; Networking"}]},{"@type":"WebSite","@id":"https:\/\/www.asminternational.org\/edfas\/#website","url":"https:\/\/www.asminternational.org\/edfas\/","name":"Electronic Device Failure Analysis Society","description":"Electronic Device Failure Analysis Society","publisher":{"@id":"https:\/\/www.asminternational.org\/edfas\/#organization"},"potentialAction":[{"@type":"SearchAction","target":{"@type":"EntryPoint","urlTemplate":"https:\/\/www.asminternational.org\/edfas\/?s={search_term_string}"},"query-input":{"@type":"PropertyValueSpecification","valueRequired":true,"valueName":"search_term_string"}}],"inLanguage":"en-US"},{"@type":"Organization","@id":"https:\/\/www.asminternational.org\/edfas\/#organization","name":"Electronic Device Failure Analysis Society","url":"https:\/\/www.asminternational.org\/edfas\/","logo":{"@type":"ImageObject","inLanguage":"en-US","@id":"https:\/\/www.asminternational.org\/edfas\/#\/schema\/logo\/image\/","url":"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2022\/10\/layout_set_logo.png","contentUrl":"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2022\/10\/layout_set_logo.png","width":360,"height":95,"caption":"Electronic Device Failure Analysis Society"},"image":{"@id":"https:\/\/www.asminternational.org\/edfas\/#\/schema\/logo\/image\/"}}]}},"acf":[],"_links":{"self":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/pages\/21","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/users\/63093"}],"replies":[{"embeddable":true,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/comments?post=21"}],"version-history":[{"count":1,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/pages\/21\/revisions"}],"predecessor-version":[{"id":8462,"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/pages\/21\/revisions\/8462"}],"wp:attachment":[{"href":"https:\/\/www.asminternational.org\/edfas\/wp-json\/wp\/v2\/media?parent=21"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}