{"id":114,"date":"2014-05-28T14:21:38","date_gmt":"2014-05-28T14:21:38","guid":{"rendered":"https:\/\/www.asminternational.org\/edfas\/membership\/member-benefits\/"},"modified":"2024-09-25T21:24:31","modified_gmt":"2024-09-25T21:24:31","slug":"member-benefits","status":"publish","type":"page","link":"https:\/\/www.asminternational.org\/edfas\/membership\/member-benefits\/","title":{"rendered":"Member Benefits"},"content":{"rendered":"<h1>Member Benefits<\/h1>\n<p><a class=\"buttonPrimary gradient\" href=\"\/wp-content\/uploads\/sites\/41\/files\/17848646\/EDFAS_Affiliate_Sell_Sheet %282%29.pdf\" target=\"_blank\" rel=\"noopener\"><span class=\"large\">View EDFAS Member Value<\/span><\/a><\/p>\n<p><a href=\"\/edfas\/news\/edfa\">EDFA Magazine<\/a> \u2013 receive Electronic Device Failure Analysis, the official magazine of the society.\u00a0 A resource for technical information developments in microelectronic failure analysis industry.\u00a0 EDFA provides insight and trends in failure analysis, reviews of lab facilities, new product announcements, recognition of outstanding contributions in the field of failure analysis and the news of the society.\u00a0 Member have free electronic access\u00a0 to current and all archive issues. View more information on the <a href=\"\/edfas\/news\/edfa\">magazine<\/a> or to <a href=\"\/edfas\/news\/edfa-contacts\">advertise<\/a>.<\/p>\n<p><a href=\"\/edfas\/events\/conference-proceedings\">FREE Access to ISTFA Proceedings<\/a> \u2013 Currently these individual papers are sorted by the year produced and can be opened in PDF format, which members can save locally or store in their online customizable bookshelves on the site for quick and handy access.<\/p>\n<p><a href=\"\/edfas\/technical\/desk-reference\">Microelectronics Failure Analysis Desk Reference, 7th Ed<\/a>. Get the most up-to-date information available. The reference contains dozens of articles covering a wide range of topics involving the failure analysis of microelectronics. Learn more &gt;<\/p>\n<p><a href=\"\/materials-resources\/journals\/\">FREE Access to Valuable Journals<\/a> – EDFAS members with an ASM membership receive electronic access to the following journals via our relationship with Springer.<\/p>\n<ul style=\"margin-left: 40px;\">\n<li style=\"margin-left: 40px;\">Metallurgical and Materials Transactions A<\/li>\n<li style=\"margin-left: 40px;\">Metallurgical and Materials Transactions B<\/li>\n<li style=\"margin-left: 40px;\">Journal of Materials Science<\/li>\n<li style=\"margin-left: 40px;\">Journal of Materials Science:\u00a0 Materials in Electronics<\/li>\n<li style=\"margin-left: 40px;\">Journal of Materials Science:\u00a0 Materials in Medicine<\/li>\n<li style=\"margin-left: 40px;\">Applied Physics A<\/li>\n<li style=\"margin-left: 40px;\">International Journal of Fracture<\/li>\n<li style=\"margin-left: 40px;\">Journal of Non-Destructive Evaluation<\/li>\n<li style=\"margin-left: 40px;\">International Journal of Mechanics and Materials in Design<\/li>\n<li style=\"margin-left: 40px;\">Metal Science and Heat Treatment<\/li>\n<li style=\"margin-left: 40px;\">Oxidation of Metals<\/li>\n<li style=\"margin-left: 40px;\">Tribology Letters<\/li>\n<\/ul>\n<p><a href=\"\/edfas\/membership\/chapters\">FREE Membership In A Chapter Near You<\/a> \u2013 EDFAS Chapters are a great place to learn and grow, and are already serving the needs of their local membership base.<\/p>\n<p><a href=\"\/edfas\/membership\/member-directory\">NETWORKING with Other Professionals<\/a> \u2013 Just follow the directory link to access a members’ only searchable database of all our EDFAS members world-wide!<\/p>\n<p><a href=\"http:\/\/careercenter.asminternational.org\/\" target=\"_blank\" rel=\"noopener\">Build Your Resume<\/a> \u2013 EDFAS needs volunteers and volunteers can learn the skills necessary for leadership, critical thinking, strategic planning and conflict resolution.<\/p>\n<p>DISCOUNTS on all EDFAS Products and Resources, including:\u00a0 <a href=\"\/edfas\/events\">ISTFA registration<\/a>, <a href=\"\/edfas\/education\">Education Courses<\/a>, <a href=\"\/edfas\/materials-resources\">Reference Books<\/a>, <a href=\"\/edfas\/membership\/savings-and-discounts\">Members-Only Programs<\/a><\/p>\n","protected":false},"excerpt":{"rendered":"<p>Member Benefits View EDFAS Member Value EDFA Magazine \u2013 receive Electronic Device Failure Analysis, the official magazine of the society.\u00a0 A resource for technical information developments in microelectronic failure analysis industry.\u00a0 EDFA provides insight and trends in failure analysis, reviews of lab facilities, new product announcements, recognition of outstanding contributions in the field of failure… <a class=\"view-article\" href=\"https:\/\/www.asminternational.org\/edfas\/membership\/member-benefits\/\">View Article<\/a><\/p>\n","protected":false},"author":63093,"featured_media":0,"parent":21,"menu_order":0,"comment_status":"open","ping_status":"closed","template":"","meta":{"_acf_changed":false,"footnotes":""},"class_list":["post-114","page","type-page","status-publish","hentry"],"bricks_content":"","yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v25.4 - https:\/\/yoast.com\/wordpress\/plugins\/seo\/ -->\n<title>Member Benefits - Electronic Device Failure Analysis Society<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.asminternational.org\/edfas\/membership\/member-benefits\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Member Benefits - Electronic Device Failure Analysis Society\" \/>\n<meta property=\"og:description\" content=\"Member Benefits View EDFAS Member Value EDFA Magazine \u2013 receive Electronic Device Failure Analysis, the official magazine of the society.\u00a0 A resource for technical information developments in microelectronic failure analysis industry.\u00a0 EDFA provides insight and trends in failure analysis, reviews of lab facilities, new product announcements, recognition of outstanding contributions in the field of failure... 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