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2015 Photo Contest Winners

 

Congratulations to this year’s winners!

 
 Category I: Color Images

1st Place:

Michael Woo

Raytheon Failure Analysis Lab

2nd Place:

Joseph Ziebarth

IM Flash Technologies, LLC

3rd Place: 

Martin Serrano

Raytheon Failure Analysis Lab

 Category II: Black and White Images

1st Place:

Noel Forrette

IM Flash Technologies, LLC

2nd Place: 

Luigi Aranda

Raytheon Failure Analysis Lab

3rd Place:

Rony R. Celetaria

Analog Devices Gen. Trias, Inc.
 Category III: False Color Images

1st Place:

Mark Kimball

Maxim Integrated Circuits

2nd Place:

Andrew Ozaeta

Raytheon Failure Analysis Lab

3rd Place:

Debra L Yencho

Texas Instruments