The 2019 edition of ASM Handbook, Volume 10: Materials Characterization provides detailed technical information that will enable readers to select and use analytical techniques that are appropriate for their problem. Each article describing a characterization technique begins with an overview of the method in simplified terms and lists common applications as well as limitations. Sample size, form, and special preparation requirements are listed upfront to help readers quickly decide if the techniques are appropriate to solve their problem. Tables and charts listing the most common characterization methods for different classes of materials are included in the beginning of the handbook. The tables give information on whether the technique is suitable for elemental analysis, qualitative analysis, surface analysis, or alloy verification. The articles also describe material characterization in general terms according to material type and serve as a jumping off point to the more specific technique articles.
Division Editors:
Thomas J. Bruno, National Institute of Standards and Technology
Ryan Deacon, United Technologies Research Center
Jeffrey A. Jansen, The Madison Group
Neal Magdefrau, Electron Microscopy Innovative Technologies
Erik Mueller, National Transportation Safety Board
George F. Vander Voort, Consultant – Struers, Vander Voort Consulting L.L.C
Dehua Yang, Ebatco
Contents:
INTRODUCTION TO MATERIALS ANALYSIS METHODS
Introduction to Material Analysis and Characterization
Characterization of Metals and Alloys
Semiconductor Characterization
Characterization of Glasses and Ceramics
Introduction to Characterization of Organic Solids and Organic Liquids
Introduction to Characterization of Powders
SPECTROSCOPY
Optical Emission Spectroscopy
Atomic Absorption Spectroscopy
Inductively Coupled Plasma Optical Emission Spectroscopy
Infrared Spectroscopy
Raman Spectroscopy
Magnetic Resonance Spectroscopy
MASS AND ION SPECTROMETRY
Solid Analysis by Mass Spectrometry
Gas Analysis by Mass Spectrometry
Glow Discharge Mass Spectrometry
Inductively Coupled Plasma Mass Spectrometry
Rutherford Backscattering Spectrometry
Low-Energy Ion-Scattering Spectroscopy
CHEMICAL ANALYSIS AND SEPARATION TECHNIQUES
Calibration and Experimental Uncertainty
Chemical Spot Tests; Presumptive Tests
Classical Wet Analytical Chemistry
Gas Chromatography
Gas Chromatography Mass Spectrometry (GC-MS)
Liquid Chromatography
Ion Chromatography
Electrochemical Methods
Neutron Activation Analysis
THERMAL ANALYSIS
Differential Scanning Calorimetry
Thermogravimetric Analysis
Dynamic Mechanical Analysis
Thermomechanical Analysis
X-RAY ANALYSIS
X-Ray Spectroscopy
Extended X-Ray Absorption Fine Structure
Particle Induced X-Ray Emission
Mossbauer Spectroscopy
X-RAY AND NEUTRON DIFFRACTION
Introduction to Diffraction Methods
X-Ray Powder Diffraction
Single-Crystal X-Ray Diffraction
Micro X-Ray Diffraction
X-Ray Diffraction Residual Stress Techniques
X-Ray Topography
Synchrotron X-Ray Diffraction Applications
Neutron Diffraction
LIGHT OPTICAL METALLOGRAPHY
Light Optical Metallography
Quantitative Metallography
MICROSCOPY AND MICROANALYSIS
Scanning Electron Microscopy
Crystallographic Analysis by Electron Backscatter Diffraction in the Scanning Electron Microscope
Transmission Electron Microscopy
Electron Probe X-ray Microanalysis
Focused Ion Beam Instruments
SURFACE ANALYSIS
Introduction to Surface Analysis
Auger Electron Spectroscopy
Low Energy Electron Diffraction
Introduction to Scanning Probe Microscopy
Atomic Force Microscopy
Secondary Ion Mass Spectroscopy
X-Ray Photoelectron Spectroscopy
Thermal Desorption Spectroscopy
REFERENCE INFORMATION
Glossary of Terms