Industry News
Keep up-to-date on the latest advances in the metals and materials industry with ASM Industry News.
- 1282 items found
Bruker stylus profiler enables 300-mm wafer analysis
Published: January 21, 2014
Bruker Nanosurfaces Division, Billerica, Mass., introduces the Dektak XTL Stylus Profiler, extending its stylus profilometry capabilities to 200 and 300 mm semiconductor wafer fabs and next-generation touch panel manufacturers.
Industry consortium to develop secure semiconductors and systems
Published: January 21, 2014
Semiconductor Research Corporation (SRC), Research Triangle Park, N.C., has launched a new initiative on Trustworthy and Secure Semiconductors and Systems (T3S).
Cadence Incisive 13.2 verification platform enables faster performance
Published: January 21, 2014
Cadence Design Systems, Inc., San Jose, Calif., introduces a faster version of the Incisive functional verification platform.
Imec celebrates 30 years of nanoelectronics industry innovation
Published: January 21, 2014
Imec, Belgium, celebrates its 30th anniversary. Founded in 1984 as a non-profit organization, it has enabled notable advancements in global semiconductor chip manufacturing in the three decades since its founding.
Soliciting EDFAS Board Nominations
Published: January 21, 2014
EDFAS is soliciting nominations for candidates for the EDFAS Board of Directors (BOD). Terms are for four years, beginning September 1, 2014 and ending August 31, 2018. All potential candidates for the BOD must be members in good standing of EDFAS at the time of their candidacy.
Micromeritics 3Flex surface characterization analyzer enables multiple analyses
Published: January 21, 2014
Micromeritics Instrument Corp., Norcross, Ga., introduces the 3Flex Surface Characterization Analyzer.
Park XE15 atomic force microscope enables automatic imaging of up to nine samples
Published: January 20, 2014
Park Systems, Santa Clara, Calif., announces the debut of Park XE15, a powerfully versatile atomic force microscope featuring a unique MultiSample scan.
Asylum Research announces the fourth Euro AFM Forum
Published: January 20, 2014
Asylum Research, Santa Barbara, Calif., an Oxford Instruments company, in conjunction with Georg-August Universität Göttingen, Germany, announces the fourth Euro AFM Forum to be held March 17-19, 2014.
Time-dependent spectroscopy enables monitoring microscopic samples
Published: January 20, 2014
Craic Technologies, San Dimas, Calif., introduces Craic TimePro kinetic spectroscopy software. It is designed to be used with Craic Technology's microspectrophotometers and their controlling Lambdafire software.
Multiple memory chips connected in shingle-stack configuration with ultra-short wirebonds
Published: January 20, 2014
Invensas Corp., San Jose, Calif., announces its latest xFD products solutions. The xFD technology connects multiple memory chips in a face-down shingle-stack configuration using ultra-short wirebonds.
