{"id":108,"date":"2022-07-21T10:15:49","date_gmt":"2022-07-21T10:15:49","guid":{"rendered":"https:\/\/www.asminternational.org\/edfas\/edfas\/"},"modified":"2025-12-03T18:29:25","modified_gmt":"2025-12-03T18:29:25","slug":"edfas","status":"publish","type":"page","link":"https:\/\/www.asminternational.org\/edfas\/","title":{"rendered":"EDFAS Home"},"content":{"rendered":"\t\t<div data-elementor-type=\"wp-page\" data-elementor-id=\"108\" class=\"elementor elementor-108\" data-elementor-post-type=\"page\">\n\t\t\t\t\t\t<section class=\"elementor-section elementor-top-section elementor-element elementor-element-60ffb642 elementor-section-full_width elementor-section-height-default elementor-section-height-default\" data-id=\"60ffb642\" data-element_type=\"section\">\n\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-default\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-100 elementor-top-column elementor-element elementor-element-caa9db8\" data-id=\"caa9db8\" data-element_type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-67021f31 elementor-widget elementor-widget-shortcode\" data-id=\"67021f31\" data-element_type=\"widget\" data-widget_type=\"shortcode.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t<div class=\"elementor-shortcode\"><div id=\"metaslider-id-8201\" style=\"width: 100%;\" class=\"ml-slider-3-99-0 metaslider metaslider-flex metaslider-8201 ml-slider ms-theme-default\" role=\"region\" aria-label=\"EDFAS Homepage Banner Ads\" data-width=\"960\">\n    <div id=\"metaslider_container_8201\">\n        <div id=\"metaslider_8201\">\n            <ul class='slides'>\n                <li style=\"display: block; width: 100%;\" class=\"slide-8204 ms-image \" aria-roledescription=\"slide\" data-date=\"2024-09-03 12:37:52\"><a href=index8088.html?utm_source=house&amp;utm_medium=bannerad&amp;utm_campaign=edfa_issue_feb&amp;utm_content=4x1housead\%22 target=\"_blank\" aria-label=\"View Slide Details\" class=\"metaslider_image_link\"><img fetchpriority=\"high\" decoding=\"async\" src=index-919.html height=\"235\" width=\"960\" alt=\"View the new issue of the electronic device failure analysis journal.\" class=\"slider-8201 slide-8204 msDefaultImage\" title=\"New Issue of EDFA Magazine Available\" \/><\/a><\/li>\n                <li style=\"display: none; width: 100%;\" class=\"slide-8203 ms-image \" aria-roledescription=\"slide\" data-date=\"2024-09-03 12:37:52\"><a href=index-920.html target=\"_blank\" aria-label=\"View Slide Details\" class=\"metaslider_image_link\"><img decoding=\"async\" src=index-921.html height=\"235\" width=\"960\" alt=\"Advertise with the electronic device failure analysis society.\" class=\"slider-8201 slide-8203 msDefaultImage\" title=\"EDFAS Media Kit\" \/><\/a><\/li>\n                <li style=\"display: none; width: 100%;\" class=\"slide-9087 ms-image \" aria-roledescription=\"slide\" data-date=\"2025-12-03 15:59:44\"><a href=indexbfdf.html?utm_source=edfas&amp;utm_medium=banner&amp;utm_campaign=imat2026_affiliate&amp;utm_content=standard\%22 target=\"_blank\" aria-label=\"View Slide Details\" class=\"metaslider_image_link\"><img decoding=\"async\" src=index-922.html height=\"235\" width=\"960\" alt=\"\" class=\"slider-8201 slide-9087 msDefaultImage\" title=\"IMAT 2026_Call for Abstracts\" \/><\/a><\/li>\n                <li style=\"display: none; width: 100%;\" class=\"slide-9166 ms-image \" aria-roledescription=\"slide\" data-date=\"2026-01-26 21:41:01\"><a href=index-923.html target=\"_blank\" aria-label=\"View Slide Details\" class=\"metaslider_image_link\"><img loading=\"lazy\" decoding=\"async\" src=index-924.html height=\"235\" width=\"960\" alt=\"\" class=\"slider-8201 slide-9166 msDefaultImage\" title=\"International Symposium for Testing and Failure Analysis ISTFA, San Antonio, Texas\" \/><\/a><\/li>\n            <\/ul>\n        <\/div>\n        \n    <\/div>\n<\/div><\/div>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<section class=\"elementor-section elementor-top-section elementor-element elementor-element-3cec425a elementor-section-boxed elementor-section-height-default elementor-section-height-default\" data-id=\"3cec425a\" data-element_type=\"section\">\n\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-default\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-66 elementor-top-column elementor-element elementor-element-30849f4d\" data-id=\"30849f4d\" data-element_type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-5b6f1ee6 elementor-widget__width-initial elementor-widget elementor-widget-text-editor\" data-id=\"5b6f1ee6\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<h2>EDFAS Members Receiving ASM Fellow in 2025<\/h2><p>In 1969, ASM established the Fellow of the Society honor to provide recognition to members for their distinguished contributions to materials science and engineering and to develop a broadly based forum of technical and professional leaders to serve as advisors to the society. ASM will recognize the 2025 Class of Fellows at the Annual Awards Banquet held during IMAT\u201925, on Tuesday, October 21st, in Detroit, MI. Tickets can be purchased with IMAT registration.<\/p><p>The following are the members recognized by their colleagues for 2025. Additional Fellows may be elected to this distinguished body in subsequent years. The solicited guidance, which the Fellows will provide, will enhance the capability of ASM as a technical community of materials science and engineering in the years ahead.<\/p><p><strong><img loading=\"lazy\" decoding=\"async\" width=\"225\" height=\"225\" class=\"size-full wp-image-8891 alignleft\" src=index-925.html alt=\"\" srcset=\"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2025\/09\/Antoniu_Nicholas.webp 225w, https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2025\/09\/Antoniu_Nicholas-150x150.webp 150w, https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2025\/09\/Antoniu_Nicholas-120x120.webp 120w, https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2025\/09\/Antoniu_Nicholas-100x100.webp 100w\" sizes=\"(max-width: 225px) 100vw, 225px\" \/>Mr. Nicholas Antoniou, FASM<\/strong><br \/>Senior Product Manager<br \/>KLA Corporation<br \/>Milpitas, CA<\/p><p>\u201c<em>For pioneering focused ion beam circuit editing, cryogenic FIB-SEM innovations, and quantitative sMIM methodologies that have transformed semiconductor metrology and accelerated product innovation.\u201d<\/em><\/p><p><img loading=\"lazy\" decoding=\"async\" width=\"225\" height=\"225\" class=\"size-full wp-image-8892 alignleft\" src=index-926.html alt=\"\" srcset=\"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2025\/09\/De-Wolf_Ingrid.webp 225w, https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2025\/09\/De-Wolf_Ingrid-150x150.webp 150w, https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2025\/09\/De-Wolf_Ingrid-120x120.webp 120w, https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2025\/09\/De-Wolf_Ingrid-100x100.webp 100w\" sizes=\"(max-width: 225px) 100vw, 225px\" \/><\/p><p><strong>Prof. Ingrid De Wolf, FASM<\/strong><\/p><div class=\"elementor-element elementor-element-f30af85 elementor-widget__width-initial elementor-widget elementor-widget-text-editor\" data-id=\"f30af85\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\"><div class=\"elementor-widget-container\"><p>Imec\/KU Leuven<br \/>Remiseboslaan 1 \/ Kasteelpark Arenberg<br \/>Leuven, Belgium<\/p><\/div><\/div><div class=\"elementor-element elementor-element-bc07c99 elementor-widget elementor-widget-text-editor\" data-id=\"bc07c99\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\"><div class=\"elementor-widget-container\"><p><em>\u201cFor pioneering research and development in the fields of microelectronic reliability, failure analysis, and Raman spectroscopy, which have enabled innovative nanoelectronics solutions.\u201d<\/em><\/p><p><a href=index-927.html target=\"_blank\" rel=\"noopener\">Learn More&gt;<\/a><\/p><hr \/><h2>EDFAS Member Receiving ASM Award Program in 2025<\/h2><p><strong>2025 ASM Award Program Recipients<\/strong><br \/><strong>ASM International Outstanding Graduate Scholar Award<\/strong><br \/>We are thrilled to announce the inaugural recipient of the Outstanding Graduate Scholar Award \u2014 a recognition for graduate students who have shown outstanding scholarly performance in the field of metallurgy\/materials science and engineering and related careers.<\/p><p><img loading=\"lazy\" decoding=\"async\" width=\"168\" height=\"168\" class=\"size-full wp-image-8893 alignleft\" src=index-928.html alt=\"\" srcset=\"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2025\/09\/Chan_Lun.webp 168w, https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2025\/09\/Chan_Lun-150x150.webp 150w, https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2025\/09\/Chan_Lun-120x120.webp 120w, https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2025\/09\/Chan_Lun-100x100.webp 100w\" sizes=\"(max-width: 168px) 100vw, 168px\" \/><\/p><p><strong>Dr. Ho Lun Chan <\/strong>University of Virginia, Materials Science and Engineering, Charlottesville<\/p><\/div><\/div><div class=\"elementor-element elementor-element-bc07c99 elementor-widget elementor-widget-text-editor\" data-id=\"bc07c99\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\"><div class=\"elementor-widget-container\"><p><a href=index-929.html target=\"_blank\" rel=\"noopener\">Learn More&gt;<\/a><\/p><\/div><\/div><p>\u00a0<\/p><p>\u00a0<\/p><div class=\"elementor-element elementor-element-bc07c99 elementor-widget elementor-widget-text-editor\" data-id=\"bc07c99\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\"><div class=\"elementor-widget-container\"><hr \/><h3><a href=index-930.html target=\"_blank\" rel=\"noopener\">2025 Lifetime Achievement Awardee – David Hung-I Su<\/a><\/h3><hr \/><h3><a href=index-931.html target=\"_blank\" rel=\"noopener\">2025 President’s Awardee – Susan Li<\/a><\/h3><\/div><\/div><hr \/><h2>Upcoming Events<\/h2><p><img loading=\"lazy\" decoding=\"async\" width=\"250\" height=\"105\" class=\"alignnone size-medium wp-image-9001\" src=index-932.html alt=\"\" srcset=\"https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2025\/11\/ISTFA-2026_Upcoming-Events-250x105.webp 250w, https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2025\/11\/ISTFA-2026_Upcoming-Events-120x50.webp 120w, https:\/\/cdn-prd-main.asm-media.cloud\/uploads\/sites\/41\/2025\/11\/ISTFA-2026_Upcoming-Events.webp 573w\" sizes=\"(max-width: 250px) 100vw, 250px\" \/><\/p><div class=\"elementor-element elementor-element-85267b8 elementor-widget elementor-widget-text-editor\" data-id=\"85267b8\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\"><div class=\"elementor-widget-container\"><h3>ISTFA 2026<\/h3><\/div><\/div><div class=\"elementor-element elementor-element-193a89c elementor-widget elementor-widget-text-editor\" data-id=\"193a89c\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\"><div class=\"elementor-widget-container\"><p>October 4-8, 2026<br \/>San Antonio, Texas<\/p><\/div><\/div><hr \/><h3><a href=index-933.html target=\"_blank\" rel=\"noopener\">Analysis Desk Reference, published by ASM International, is now available<\/a><\/h3><hr \/><h3><a href=index-934.html target=\"_blank\" rel=\"noopener\">View the <em>EDFA<\/em> Digital Edition<\/a><\/h3><hr \/><h3>SPOTLIGHT VIDEO:<\/h3><p>Meet the panelists of the Women in EDFA session at ISTFA 2025 in Pasadena and discover the unique insights they bring to the electronic device failure analysis community.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-e6e52ad elementor-widget elementor-widget-video\" data-id=\"e6e52ad\" data-element_type=\"widget\" data-settings=\"{&quot;youtube_url&quot;:&quot;https:\\\/\\\/www.youtube.com\\\/watch?v=YNWVFGoqt9g&quot;,&quot;video_type&quot;:&quot;youtube&quot;,&quot;controls&quot;:&quot;yes&quot;}\" data-widget_type=\"video.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t<div class=\"elementor-wrapper elementor-open-inline\">\n\t\t\t<div class=\"elementor-video\"><\/div>\t\t<\/div>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t<div class=\"elementor-column elementor-col-33 elementor-top-column elementor-element elementor-element-55f4c008\" data-id=\"55f4c008\" data-element_type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-0d35ab1 elementor-widget elementor-widget-image\" data-id=\"0d35ab1\" data-element_type=\"widget\" data-widget_type=\"image.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<a href=index-935.html>\n\t\t\t\t\t\t\t<img loading=\"lazy\" decoding=\"async\" width=\"469\" height=\"375\" src=index-936.html class=\"attachment-full size-full wp-image-8976\" alt=\"\" \/>\t\t\t\t\t\t\t\t<\/a>\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<\/div>\n\t\t","protected":false},"excerpt":{"rendered":"","protected":false},"author":63093,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"open","ping_status":"closed","template":"page-full.php","meta":{"_acf_changed":false,"footnotes":""},"class_list":["post-108","page","type-page","status-publish","hentry"],"bricks_content":"","yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v25.4 - https:\/\/yoast.com\/wordpress\/plugins\/seo\/ -->\n<title>EDFAS Home - Electronic Device Failure Analysis Society<\/title>\n
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